Tests of single event upset (SEU) and single event latch-up (SELU) rates in the VA1/VA1TA integrated circuits for SVD upgrade

Aim:

• Measure SEE rates of VA1 and VA1TA read-out chips when exposed to high intensity laser light

Test set-up, status reports:

• P. Krizan, S. Korpar, VA1/VA1TA test program and status, talk at SVD meeting in Vienna, June 11, 2001
• 2 dimensional surface scan set-up
• Optical system for laser focussing on a 1.5 micron diameter spot
• Photographs of the set-up
• P. Krizan, S. Korpar, VA1/VA1TA test status, report for the SVD group, Sept. 28, 2001
• VA1 in the set-up: photo before closing the metal housing, top view with VA1 in the metal housing.
• Photograph of the power laser set-up

Talks:

• S. Korpar,  11th International Workshop on Vertex Detectors (Vertex 2002), Kona, Kailua, Hawaii, 3-8 Nov 2002.

Published paper:

• S. Korpar, P. Krizan, S. Fratina, Nucl.Instrum.Meth.A511:195-199, 2003

Other articles, reports on SEE:

• M. Huhtinen, F. Faccio, "Computational method to estimate Singe Event Upset rates in an accelerator environment", NIM A450 (2000) 155-172 (pdf)
• McMorrow D, Melinger JS, Buchner S, et al., "Application of a pulsed laser for evaluation and optimization of SEU-hard designs", IEEE TNS 47 (2000) 559
• NASA Jet propusion lab studies
• AMS (space station) study and references

VADAQ Documentation

• Bjorn Sundal's thesis chapter
• Dan Marlow's VADAQ documentation directory

SVD general

• Dejan Zontar, Belle SVD, seminar, Ljubljana Oct 2 2001

SVD read-out, Princeton page

Ideas homepage

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